International Journal For Multidisciplinary Research
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Volume 6 Issue 6
November-December 2024
Indexing Partners
Optimizing Gate-Level Simulation Performance Through Cloud-Based Distributed Computing
Author(s) | Kaushik Velapa Reddy |
---|---|
Country | United States |
Abstract | Gate-level simulation (GLS) has emerged as an indispensable verification methodology in modern ASIC design flows, particularly as process nodes advance below 5 nm and design complexities increase exponentially. This comprehensive article examines the critical role of GLS in addressing verification challenges that RTL-level simulation alone cannot resolve, including timing validation, power-aware verification, and X-propagation analysis. Recent studies have shown that up to 35% of silicon failures in advanced nodes can be attributed to issues only detectable through gate-level simulation, highlighting its crucial role in reducing costly re-spins. The analysis of 127 industrial ASIC projects reveals that integrated GLS methodologies, particularly those incorporating machine learning techniques, have achieved a 47% reduction in verification time while maintaining 99.8% coverage metrics. This article systematically evaluates emerging trends, including cloud-based distributed simulation frameworks demonstrating a 3.2x speedup in automotive-grade IC verification workflows and novel artificial intelligence applications in predicting critical verification scenarios. Furthermore, it proposes a comprehensive framework for integrating GLS with advanced power analysis techniques, specifically addressing the challenges of multi-voltage designs and power-gating verification in IoT and automotive applications. This article contributes to the growing knowledge of hardware verification methodologies while providing practical insights for implementing efficient GLS strategies in contemporary ASIC design flows. |
Keywords | Keywords: Gate-Level Simulation (GLS), ASIC Design Flow, Electronic Design Automation (EDA), Design for Test (DFT), Static Timing Analysis (STA), Automatic Test Pattern Generation (ATPG) |
Field | Computer |
Published In | Volume 6, Issue 6, November-December 2024 |
Published On | 2024-11-25 |
Cite This | Optimizing Gate-Level Simulation Performance Through Cloud-Based Distributed Computing - Kaushik Velapa Reddy - IJFMR Volume 6, Issue 6, November-December 2024. DOI 10.36948/ijfmr.2024.v06i06.31349 |
DOI | https://doi.org/10.36948/ijfmr.2024.v06i06.31349 |
Short DOI | https://doi.org/g8r8jr |
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