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International Journal For Multidisciplinary Research
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Study of Stuctural, Optical and Morphologycal Properties of Post Annealed Nanocrystalline CdSe Thin Films
Author(s) | Dhaneswar Kalita |
---|---|
Country | India |
Abstract | CdSe nano crystalline thin films are deposited on cleaned glass substrates using the thermal evaporation technique under vacuum (~10-5 torr). The prepared films are post annealed at 330K, 333K, 360K,373K,410K, 473K and 450K. The structural and optical properties of CdSe as-grown and annealed nano crystalline thin films are studied. The CdSe nano crystalline thin films are characterized by X-ray diffraction, ultraviolet visible spectroscopy and scanning electron microscopy techniques. A set of 30 nos CZ metal interference filters (ranging from 333 to 1050 nm) are used for monochromatic radiation. Annealing improves the crystalline of CdSe thin films and the FWHM of XRD peaks decreases. It is found that annealing increases the transmittances. The optical band edge of the CdSe thin films having different grain distribution is estimated from the absorptance data of UV-VIS spectrophotometer. The calculation of optical band gap by UV-VIS spectrum reveals strong red-shift with increase in crystallite size indicating the charge confinement in CdSe nanocrystallite. The optical band gap at different annealing temperatures is estimated from experimental data. The influence of the annealing at different temperatures are studied both on real and imaginary di-electrict constants of CdSe nano crystalline thin films. |
Keywords | Nano crystalline, polycrystalline, grain size, band gap, di-electric constant |
Published In | Volume 2, Issue 2, March-April 2020 |
Published On | 2020-03-11 |
Cite This | Study of Stuctural, Optical and Morphologycal Properties of Post Annealed Nanocrystalline CdSe Thin Films - Dhaneswar Kalita - IJFMR Volume 2, Issue 2, March-April 2020. |
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E-ISSN 2582-2160
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CrossRef DOI is assigned to each research paper published in our journal.
IJFMR DOI prefix is
10.36948/ijfmr
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