International Journal For Multidisciplinary Research
E-ISSN: 2582-2160
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Impact Factor: 9.24
A Widely Indexed Open Access Peer Reviewed Multidisciplinary Bi-monthly Scholarly International Journal
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Volume 6 Issue 6
November-December 2024
Indexing Partners
Success in Reducing Testing Time with AI-optimized Solutions
Author(s) | Divyansh Jain |
---|---|
Country | United States |
Abstract | This article examines implementing AI-optimized solutions to reduce testing time across manufacturing and development environments. The article explores how machine learning techniques can effectively address traditional testing bottlenecks while maintaining quality standards. The article demonstrates the transformative potential of ML-driven testing optimization by analyzing implementations across various industries, including pharmaceutical, electronics, and software development sectors. The findings highlight significant improvements in testing efficiency, resource utilization, and defect detection by integrating advanced predictive models, real-time adaptation systems, and cross-functional integration strategies. The article also identifies key success factors such as data quality management, balanced testing approaches, continuous model refinement, and stakeholder engagement that are crucial for successfully implementing ML-based testing solutions. |
Keywords | Machine Learning Testing Optimization, Quality Control Automation, Manufacturing Process Efficiency, AI-Driven Defect Detection, Smart Manufacturing Systems |
Field | Computer |
Published In | Volume 6, Issue 6, November-December 2024 |
Published On | 2024-12-12 |
Cite This | Success in Reducing Testing Time with AI-optimized Solutions - Divyansh Jain - IJFMR Volume 6, Issue 6, November-December 2024. DOI 10.36948/ijfmr.2024.v06i06.32639 |
DOI | https://doi.org/10.36948/ijfmr.2024.v06i06.32639 |
Short DOI | https://doi.org/g8vgh9 |
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E-ISSN 2582-2160
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