
International Journal For Multidisciplinary Research
E-ISSN: 2582-2160
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Impact Factor: 9.24
A Widely Indexed Open Access Peer Reviewed Multidisciplinary Bi-monthly Scholarly International Journal
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Subthreshold Conduction in MOS Transistors
Author(s) | Tarun Parmar |
---|---|
Country | United States |
Abstract | Analytical models are reviewed in this paper which accounts for drain current in subthreshold region of operation of MOS transistor. Standard modeling approaches are discussed in the form of long-channel and short channel. The comparison of the theoretical models is discussed with experimental models [1, 2]. The drain current dependence on gate bias is reviewed as subthreshold slope. Tunnel transistors having subthreshold swing less than the conventional limit are discussed. |
Keywords | Subthreshold Conduction, Subthreshold Slope, Subthreshold Swing, Interband Tunnel Transistors. |
Field | Engineering |
Published In | Volume 1, Issue 1, July-August 2019 |
Published On | 2019-07-10 |
DOI | https://doi.org/10.36948/ijfmr.2019.v01i01.35937 |
Short DOI | https://doi.org/g82wng |
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E-ISSN 2582-2160

CrossRef DOI is assigned to each research paper published in our journal.
IJFMR DOI prefix is
10.36948/ijfmr
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